Kempten, Germany +49 (0) 831 - 73


40 years RMSKempten

by RMSKempten

40 years of software, laboratory tests and training - 40 years of RMSKempten

Today is the day, we are celebrating our 40th anniversary!


More than forty years ago, during his doctorate, Mr. Wassermann began to create software for X-ray diffraction on the 8-bit computers that were just coming onto the market at the time.

Device control and measurement data acquisition were the first applications that were soon used as standard in what was then the Mineralogical-Petrographical Institute of the LMU Munich. It did not take long for the manufacturers of diffractometers to become aware of this development, and the first software package for the XRD was launched in 1981 under the name ADM, offering device control, measurement data acquisition, basic data evaluation, phase analysis and lattice constant refinement.

In the same year the company RMSKempten (Röntgenanalytik.Meßsysteme.Software) was founded and with his first comrade-in-arms and lifelong friend Dr. Günter Lorenz became the business areas

  • XRD software,
  • XRD laboratory (phase analysis, residual stress, texture analysis) and
  • Education (user training, seminars and workshops)

brought to life.

Today, RMSKempten offers its sales partners corporate fitted, ready-to-use software solutions for almost all applications required for the XRD.

More News

by Toni Höltke

ADM Suite finds rare minerals

A customer sent us a small amount of a substance he found in the formic acid solution after acid treatment of a mineral stage. It turns out that this is a secondary formation of formicaite (Ca-formate) during acidification:

Read more …

by RMSKempten


We have been developing XRD laboratory software for more than 40 years. Our software has proven to be a great asset for our customers in terms of reliability, quality assurance, flexibility and user-friendly interface. We are confident that the new generations of ADM Suite releases will continue to meet your needs!

Among other things, we have developed the software packages Stress and Stress Plus from Malvern Panalytical. These are supplied as standard analysis software for XRD instruments sold by Malvern Panalytical worldwide. For more information about the software, visit


Become part of our team !

We are currently looking for highly qualified technicians and programmers with excellent knowledge of Visual Basic and Visual Studio. Scientific knowledge and knowledge of XRD applications in laboratory operations are an advantage as we build and configure our powerful ADM Suite platform for a variety of XRD systems.

Our work is mainly done online, but occasionally we spend a few days or more on-site with clients, both in Germany and across Europe and the rest of the world. Our main focus is on geoscientific and mineralogical applications, however the ADM Suite is highly customizable and can be used in almost any diffraction application.

If you are interested in becoming part of our team, please send an email to and tell us more about your qualifications and expertise. We look forward to hearing from you!


Read more …

by RMSKempten

XRD for Paper Analyses

Cellulose is the most abundant polymer on earth and the main component of paper and paper products. The high quality demands placed on paper today necessitate the addition of inorganic fillers and pigments., originally intended to save expensive fiber material. It was soon recognized that the properties of the paper could be increased and controlled by the fillers.

Our example shows an XRD phase analysis of a brown packaging paper: In addition to the fiber cellulose (68 weight %), it contains 32 weight % of fillers: talc, kaolinite and calcium carbonate.

Read more …

by RMSKempten

Cell Refinement & Pattern Indexing

The cell parameters of crystalline substances are determined or refined. The module is able to separate and index the individual crystalline phases from measurements of substance mixtures.
The measured interferences are indexed according to crystal classes, lattice parameters and extinction rules.
As an example you can see this application on the measurement data of a technical anatase (TiO2).

Read more …

by RMSKempten

Crystallite size and Microstress

nThe grains of a powdered material are themselves composed of smaller polycrystalline crystallites. They determine the physical properties of the material.

The size and residual stress of these crystallites can be easily determined in ADM Suite.

Using the example of a tungsten powder, the grain size of which the manufacturer specifies as < 10 µ, the crystallite size is determined to be 256.6 ± 6.6 Å (25.7 ± 0.7 nm) and a negligible internal stress (microstress) of 0.067 ± 0.005%:

Read more …

by RMSKempten

Upgrade your XRD system with ADM Suite.

The control of X-ray diffractometers from different manufacturers with the provision of extremely comprehensive measurement methods through the ADM-Connect module makes ADM Suite particularly suitable for upgrading XRD systems that have been in operation for a long time.

Read more …

by RMSKempten

Only in ADM: Isoangular sections

The option to make isoangular sections is a unique selling point of the ADM software package. It gives the user the option of displaying intensities at the same diffraction angles from different diffractograms. This enables a visual representation of the intensity curve of identical interferences in several diffractograms and thus increases the efficiency in the analysis of material samples.

One application is the analysis of multiple components in a substance at different temperatures to follow reactions. The following 3D representation shows several diffractograms at synthesis temperatures between 600 and 640 degrees Celsius, which contain the quartz, calcite and wollastonite phases. The formation reaction of wollastonite from calcite and quartz  can be seen very well in the isoangular section (second image).

In the isoangular sections , the transformation of the phases can be seen very well (point of intersection):

No other analysis program offers you as many possibilities as ADM. Download your free trial today!

Read more …

by RMSKempten

Interview in Wiley Analytical Science Magazine

Róisín Murtagh, Editor for Wiley Analytical Science Magazine, interviews Dr. Alfred Wasserman,
Owner and CEO of RMSKempten. The subject of the interview is X-ray diffraction (XRD) and its development over the years.

The full article can be downloaded from the downloads page.

Read more …