News
ADM Suite Version 10 is available from today
by RMSKempten
The list of new features and improvements is long. Here are the highlights of the individual modules:
- ADM Connect: Diffractometer control and data sampling have been enhanced with grazing incidence for theta/2theta goniometers, unidirectional and multidirectional residual stress measurements, and texture measurements.
- ADM Base: Automatic α1/α2 and gap corrections for corresponding measurements.
- XPads: The phase analysis module now displays improved qualitative phase analysis; the quantitative phase analysis calculates missing or amendable I/Ic values from the structural parameters.
- Reporting has been expanded and improved.
- Databases: In addition to the ICDD databases PDF-2 and PDF-5, we integrate the RUFF database and the RMSK database (created from the OCD data sets).
A 30- or 60-day trial version is now available for download on our website.
More News
by RMSKempten
Cell Refinement & Pattern Indexing
by RMSKempten
Crystallite size and Microstress
nThe grains of a powdered material are themselves composed of smaller polycrystalline crystallites. They determine the physical properties of the material.
The size and residual stress of these crystallites can be easily determined in ADM Suite.
Using the example of a tungsten powder, the grain size of which the manufacturer specifies as < 10 µ, the crystallite size is determined to be 256.6 ± 6.6 Å (25.7 ± 0.7 nm) and a negligible internal stress (microstress) of 0.067 ± 0.005%:
by RMSKempten
Upgrade your XRD system with ADM Suite.
The control of X-ray diffractometers from different manufacturers with the provision of extremely comprehensive measurement methods through the ADM-Connect module makes ADM Suite particularly suitable for upgrading XRD systems that have been in operation for a long time.
by RMSKempten
Only in ADM: Isoangular sections
The option to make isoangular sections is a unique selling point of the ADM software package. It gives the user the option of displaying intensities at the same diffraction angles from different diffractograms. This enables a visual representation of the intensity curve of identical interferences in several diffractograms and thus increases the efficiency in the analysis of material samples.
One application is the analysis of multiple components in a substance at different temperatures to follow reactions. The following 3D representation shows several diffractograms at synthesis temperatures between 600 and 640 degrees Celsius, which contain the quartz, calcite and wollastonite phases. The formation reaction of wollastonite from calcite and quartz can be seen very well in the isoangular section (second image).
In the isoangular sections , the transformation of the phases can be seen very well (point of intersection):
No other analysis program offers you as many possibilities as ADM. Download your free trial today!
by RMSKempten
Interview in Wiley Analytical Science Magazine
Róisín Murtagh, Editor for Wiley Analytical Science Magazine, interviews Dr. Alfred Wasserman,
Owner and CEO of RMSKempten. The subject of the interview is X-ray diffraction (XRD) and its development over the years.
The full article can be downloaded from the downloads page.
by RMSKempten
Phase analysis of a riverbank sand
The Iller flows directly in front of the RMSKempten laboratory. In addition to water, the Iller transports large amounts of sediment from the Alps downstream. These are stored on the shore along the river as sand.
Our XRD tells us what this sand is made of:
This analysis was performed with ADM Suite. Download your free trial here.