Kempten, Germany +49 (0) 831 - 73 345info@rmskempten.de

Workshops & trainings

RMSKempten offers courses and training for users of X-ray diffraction with the following contents:

Fundamentals of X-ray Powder Diffraction

This course is offered to relative newcomers and to experienced users who want to heighten their knowledge of the fundamental principles and established procedures. The participant will become familiar with the basics of single and multi phase analysis and practices with many analysis files to handle the modern analysis methods.

General

  • Introduction to the x-ray diffraction
  • Selection and construction of data collection procedures
  • Correction of measured data
  • Representation of the data collected
  • Presentation of the results

Qualitative phase analysis

  • JCPDS-PDF databases User defined databases
  • User created databases Web-databases
  • Subfiles
  • Analysis without standard
  • Analysis with standard, internal standard, external standard
  • Analysis of modifications

Quantitative phase analysis

  • Single Line
  • Full pattern
  • RIR-factor
  • Corrections

Special X-ray diffraction (XRD)

This course introduces to the more experienced analytical and crystallographic methods. The user learns to interpret the measured and calculated data and the application in the qualitative and quantitative phase analysis.

Profile Analysis

  • Introduction, theory and application in phase analysis and crystallographic analysis.

Multi scan analysis

  • 2D and 3D graphs of sets of scans, iso-angular sections and their meanings.

Residual stress

  • Introduction, theory and application.

Micro-stress

  • Introduction, theory and application.

Crystallite size analysis

  • Introduction, theory and application.

Lattice refinement

  • Introduction, theory and application in phase analysis.

Indexing

  • Introduction, theory and application in phase analysis.

Are you interested ?

Take the first step and send an email, a telefax or simply call us. You will see, we are here for you.