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ADM-Connect from RMS is an up to date software to control the XRD equipment of multiple suppliers and to collect the data of powder and residual stress measurements. The universal applicability of this software module for equipment of different manufacturers, as well as providing very extensive measurement methods, makes ADM-Connect suitable for the routine operation and for research purposes as well.

This application runs with 32- and 64-bit WINDOW® operation systems. It features an up-to-date split-screen user interface to gua­rantee a complete overview of the running scan,   pa­rameter and numerical peak determination results in one application window. The complete on-line help system explains every function specific to the program. ADM Connect includes clipboard support for texts, tables and graphics. Print and ex­port functions for scans, results and gra­phics offer a comprehensive tool for all kinds of reports.

ADM-Connect was developed

  • for controlling diffractometer systems from various manufacturers to provide a same, simple and intuitive user interface for a variety of diffractometers,

  • to offer all machines the same wide range of measurement procedures and measurement methodologies. To guarantee that the measured data of different XRD  can easily be compared with each other, combined and processed.

  • XRD of different manufacturers can be controlled by ADM Connect. This reduces the user interfaces of your analyzers and increase the analysis throughput.

ADM-Connect offers multiple measuring procedures and measuring methods:

Direct Mode

Direct mode opens a direct connection to the controlling computer of the diffractometer unit. Using the firmware codes with the keyboard of your computer you can directly control the diffractometer. This mode is intended for service and individual runs. The main machine instructions of the various devices are displayed during the session on the screen.

Single Measurement Mode

By this we mean the so-called normal operation: A sample is measured by angle A to angle B with fixed parameters such as angular speed or step size and count time. Continious scan (constant speed of the goniometer) and step scan measurements are supported in this mode. During the measuring process, among other things, the graph of the diffractogram and the numerical data of the current measurement are displayed on the screen.

This mode is available with and without a sample changer control. In sample changer operation may be run for each preparation a different measurement program. In single measurement mode, one scan is performed on each sample.

Interval Measurement

This method of measurement optimizes your measurement time. Automatically, only the 2-theta areas are measured that are of interest to you. The goniometer is moved with maximum speed between these areas. Or you scan the predetermined angular interval several times to lower the detection limit your diffractometer by minimizing the statistics,. Or set a wait time between measurement processes and analyze kinetic processes in your preparation. Control. ADM-Connect an attached sample heating or cooling This mode also is available with and without a sample changer control. In this method, a plurality of scans are performed on each specimen.

Repetition of Measurements over the same angular range

A waiting time between the scans can be inserted, a temperature controller can be operated, or the gas phase can be changed in an autoclave.

Interval measurements over different angular ranges

You measure only the angular intervals of interest. Uninteresting area in the diffractogram are skipped.


Quantitative phase analysis runs on-line and automated from the diffractometer. By combining the interval measurement with the RIR based quantitative phase analysis, this option is ideal for standardized screening, monitoring tasks and industrial quality tests.

Measuring at the Peak-Maximum

Here, the detector counts at the position of the reflection maximum and measures the count rate after previously the intensity of the background has been determined.
The peak position is given by

a) a predetermined diffraction angle  or

b) a search/calculation of the intinsity maximum.

Measuring the reflexion profile

In the area measurement, the count rate is not determined by the reflection maximum, but the sum of the intensities under the reflex profile.

Residual Stress Measurement

With this option, you create measurement series required for residual residual stress analysis. Single-axis, two-and three-axis measurement rules can easily be created quickly and intuitively.

During the measuring process, among other things, the graph of the diffractogram and the numerical data of the current measurement are displayed on the screen.

Individual Presets

Each user can modify the default setting and save as individual default in its special user area or thematic area. Various user areas reflect the personal preferences of different users (user areas) or show specially selected presets for the processing of measured data from different sample materials (subjects).

User / subject area

A completely integrated user/subject area structure is a key element of this modern user interface. Every user and every subject can be stored separately from other users or subjects in a specified, code-protected user area. Each area owns a default structure (factory default) for every possible decisi­on the user can take.

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