ADM-Base

ADM Base from RMS combines classical single scan processing with multiple peak position determination methods and a completely new multi scan analysis method to describe kinetics, thermodynamics or statis­tics of phase reactions. A free choice of user-configurable defaults plus the instant recalculation of all re­sults upon the smallest change of input parameters make ADM Base suitable for routine analysis as well as for research.

This application features an up-to-date split-screen user interface to gua­rantee a complete overview of scan, pa­rameter and numerical peak determination results in one application window. The complete on-line help system explains every function specific to the program. ADM Base includes clipboard support for texts, tables and graphics. Print and ex­port functions for scans, results and gra­phics offer a comprehensive tool for all kinds of reports. A scan processing can be saved at any stage and re-opened later for further eva­luation as if the session was never inter­rupted.

X-ray powder diffraction mea­surement

ADM Base is dedicated to the peak posi­tion and intensity determina­tion, scan manipulation such as combining multi­ple scans (addi­tion), subtracting scans, conver­sions from automatic divergence slit (ADS) to fixed divergence slit (FDS) and vice versa and K-Al­pha2 stripping, profile fitting, in­dexing,  lattice constants calcula­tion and refinement, analysis of crystallite sizes and analysis of micro stress. Fur­thermore it offers a unique routine to create intensity sections through an ar­bitrary set of scans at a fixed 2Theta angle. This very user friendly software allows you to rotate a 3D sight of mul­tiple scans absolutely free in all directi­ons and adjust your isoangular section graphically as well as numerically. The sections are shown in an separate in­tensity/x diagram (2Theta = const.) with a freely scalable x-axis (time, tempera­ture, pressure etc.). The points of intersection of the isoangular intensity graphs indicate reaction points, phase transitions and other points of high interest. The measurements are typically performed on a powder diffraction sys­tem as commonly applied for phase analysis.

Pattern Treatment

ADM Base offers a wide range of pattern treatments:

• Two different methods to de­termine the exact position (posi­tion of maximum and center of gravity)

• Two methods to determine the position of the maximum (para­bola fit and counting maximum)

• Two methods for smoothing (moving window averaging and Savitzki-Golay filter )

The measured scans are treated and corrected for:

• Automatic divergence slit inten­sity deviation

• Background subtraction (auto­matic fitting or manual editing)

• K-Alpha2 wavelength

• Lorenz-Polarization factor (four different models covering sam­ples with random orientation or strong texture and either narrow or broad diffraction peaks.)

• 2Theta shift (one point or two points correction)

Peak Determination

ADM Base offers two different methods to determine the peak parameters:

• Classical graph analysis
• Second derivative

The exact peak position can be determined as

• Center of Gravity (Neff or Schliephake)
• Position of the maximum (maximum count rate or parabola fit)

The following parameters are calculated for each peak from the scanned pattern:

• Center of gravity
• Position of the maximumRelative integral intensity
• Relative integral intensity
• FWHM
• Counting rate at maximum position
• Peak area
• Ascending flank
• Descending flank
• Standard deviation (I)
• Value for crystallinity

Instant Recalculation

ADM Base calculates all results instantly. The change of every single parameter and its influence on the complete analysis is directly reflected in the results. Graphical and numerical feedback is given to the user at any stage of the scan processing in real time. This innovative and unique concept of our software philosophy helps beginners to understand the im­portance of each parameter and to decide whether to apply a certain correction or not.

Routine Analysis

The possibility to generate a set of user/subject areas enables you to set up ADM Base for routine scan processing as well. No advanced knowledge is required and the analysis is carried out performing two simple steps:

• Select and load measurement file
• Print a full report of the scan analysis

User defaults

Every user can modify the factory defaults and save it as user defaults in the specific user area. Multiple user areas reflect the personal preferences of the various users (user areas) or repre­sent dedicated choices to process the scans of different materials (subject areas).

User / subject area

A completely integrated user/subject area structure is a key element of this modern user interface. Every user and every subject can be stored separately from other users or subjects in a specified, code-protected user area. Each area owns a default structure (factory default) for every possible decisi­on the user can take.

Multi Scan Processing and Isoangular Sections

A maturated tool for 2D and 3D re­presentation of the measured scans makes it easy to track fluctuations in intensity or reflection angle over many measurement periods. New and unique is the possibility to create intensity sections, so called isoangular sections, directly from the 2D or 3D graph. Move the sectional plane, which is pa­rallely shown on the screen with the mouse to the interesting diffraction angle (reflection). Fix the isoangular intensity curve in the diagram and add further isoangular sections from diffe­rent reflections.

The intensities shown in the isoangular section can be corrected with RIR values.Using this tools makes it very easy in an ele­gant and quick way to visualize the equilibria of chemical re­actions, phase transitions or other kinetic and thermodynamic processes. Just as simple is to visualize the temporally variation (drifts) of intensities. Therefore ADM Base is the software of choice for X-ray production control and quality assurance.
Use this tool for depiction of intensity variation as function of another parameter as time, temperature, pressure, distance, composition, concentration etc. Never before the depiction of an equation of state was so easy.
And you manage another important supervising of your equipment with the twinkling of an eye. Examine the time constancy of your X-ray tube by measuring a standard sample time by time. Add the current scan to the multiplot of the for­merly measured standard scans and show the long time pro­perty of your X-ray source in an isoangular section.